350-016002 - MappIR Automated Sampling Accessory
Description:
Installation and user guide for the MappIR automated sampling accessory
The PIKE MappIR accessory is a sample compartment accessory for the analysis of semiconductor wafers.The accessory may be configured to allow the analysis of the wafer either in reflection or transmission.Changing from reflectance to transmission is by means of a single slide control.
Environment:
- FT-IR
- MappIR
Attachment(s):
| File | Last Modified |
|---|---|
| 350-016002 - MappIR Automated Sampling Accessory.pdf | August 04, 2022 |