FT-IR - Introduction to Diffuse Reflectances Infrared Fourier Transform Spectroscopy - Technical Note
Description:
Diffuse reflectance has long been employed as a versatile sample analysis technique for ultraviolet, visible, and infrared spectroscopic analyses. [1,2] Initially, its use was restricted to the ultraviolet/visible or near-infrared regions of the spectrum because of the low energy throughput of many diffuse reflectance sampling devices, restrictions in spectrometer hardware, and acquisition procedures. With the advent of Fourier transform infrared spectrometers and improvements in diffuse reflectance accessory design, the technique became practical for routine use in the mid-infrared region. Currently, Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFTS) offers a number of advantages as a sample analysis technique, including:
• minimal or no sample preparation
• very high sensitivity (down to low ppm levels)
• applicability across a wide range of sample concentrations
from parts per million to neat
• ability to analyze most non-reflective materials,
including highly opaque or weakly absorbing
materials
• ability to analyze irregular surfaces or coatings,
such as polymer coatings on glass fibers
• suitability for very large, intractable samples
through the use of specialized sampling devices
Environment:
FT-IR
Attachment(s):
| File | Last Modified |
|---|---|
| FT-IR - Introduction to Diffuse Reflectance Infrared Fourier Transform Spectroscopy - Technical Note.pdf | August 04, 2022 |