269-3745 Nicolet RaptIR X User Manual
Introduction
This manual provides instructions for the installation, operation, and maintenance of the Nicolet™ RaptIR™ X microscope.
It is intended for users who will be responsible for the usual operation and upkeep of the instrument.
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For detailed safety and site preparation information, refer to the Safety Information & Site Preparation Manual. |
Notices
For Research Use Only. Not for use in diagnostic procedures.
© 2026 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific and its subsidiaries unless otherwise specified.
Linkam™ is a registered trademark of Linkam Scientific Instruments Ltd.
Windows is either a registered trademark or trademark of Microsoft Corporation in the United States and/or other countries.
Safety information
A full description of potential safety hazards, precautions, and site preparation requirements is provided in the Safety Information & Site Preparation Manual.
In this manual, hazards and their mitigations are discussed in the context of safe operation and maintenance of the instrument.
Manufacturer information
This section identifies the manufacturer and provides basic contact information for questions about the instrument, service, or replacement parts.
| Item | Information |
|---|---|
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Manufacturer name |
Thermo Fisher Scientific Inc. |
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Manufacturer address |
5225 Verona Rd, Madison, WI 53711, USA |
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Website |
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Customer support |
https://www.thermofisher.com/us/en/home/technical-resources/instrument-support.html |
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Service and replacement parts |
Symbols and conventions
This section explains the symbols, signal words, and formatting conventions used in this manual.
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Avoid hazard. Indicates a hazardous situation which, if not avoided, will result in serious injury or death. |
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Avoid hazard. Indicates a hazardous situation which, if not avoided, could result in serious injury or death. |
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Avoid hazard. Indicates a hazardous situation which, if not avoided, could result in minor or moderate injury. |
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Follow instructions. Indicates information related to property damage, system damage, or loss of data. |
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Provides helpful or supplementary information. |
Instrument symbols
The following symbols may appear on the instrument or in this documentation:
| Symbol | Description |
|---|---|
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Indicates a potential hazard. Follow all instructions to avoid injury. |
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Indicates a pinch point hazard. Keep hands and fingers clear of moving parts. |
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Indicates a cold temperature hazard. Read the documentation for safe handling instructions. |
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Indicates an explosion hazard. Read the documentation for safe handling instructions. |
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Directs the user to read the manual for important safety information. |
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Indicates a requirement to wear gloves. Read the documentation for specific requirements. |
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Indicates a requirement to wear an apron. Read the documentation for specific requirements. |
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Indicates a requirement to wear a face shield. Read the documentation for specific requirements. |
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Indicates a USB 3.0 connection point. |
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Indicates a DC power connection point. |
Documentation conventions
This manual uses the following formatting conventions:
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Bold text indicates buttons, controls, or user interface elements.
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Step-by-step procedures are presented as numbered lists.
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Important safety information is presented before the relevant procedure.
Important safety notice
If the equipment is used in a manner not specified by the manufacturer, the protection provided by the equipment may be impaired.
Product overview
This section provides an overview of the microscope, including its main features, components, and supported accessories.
Intended use
The Nicolet™ RaptIR™ X FTIR Microscope System is a Fourier-transform infrared (FTIR) microscope intended for use by trained personnel in a controlled laboratory to perform spectroscopic measurements.
Use the instrument only as described in the applicable documentation.
With the Nicolet™ RaptIR™ X microscope, you can quickly find your target, collect high-resolution visual images, and generate high spatial resolution IR data for analysis.
Overview of features and capabilities
Key features of the system include:
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High-performance spectroscopic measurement capabilities, including better than 1 micron visual spatial resolution and better than 5 micron IR spatial resolution
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Easy, open access for sample handling
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Software for data acquisition and analysis
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Compatibility with a range of accessories
System components and configurations
The microscope is available in a range of configurations to suit your research and is compatible with a variety of accessories.
The two core configurations for the system determine the IR source.
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Nicolet RaptIR X connected to an FTIR spectrometer (e.g., the Nicolet iS50 or Nicolet Apex spectrometers)
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Nicolet RaptIR X with the RaptIR X SAM, which is an integrated system with a built-in spectrometer. The SAM module attaches the RaptIR X microscope in place of a spectrometer.

| Core configuration | |
|---|---|
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Spectrometer source |
FTIR spectrometer
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Nicolet™ RaptIR™ X SAM (integrated configuration) |
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| Microscope configuration | |
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Turret type |
Manual turret (not upgradeable)
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Automated Turret
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Sample viewing |
Monocular (camera only, viewable in software) |
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Trinocular (camera and eyepiece) |
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Objectives and optical components |
4× glass objective |
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40× LWD infinity-corrected glass objective |
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GAO (grazing angle objective) |
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| Stage and motion control | |
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Stage type |
Manual X–Y Stage (upgradable by service personnel) |
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Automated stage (Includes slide holder plate with built-in gold disk for automatic background collection) |
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Stage control |
Software control |
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Joystick |
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Specialty stages |
Linkam heating/cooling stage |
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Instec temperature control stage |
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Stage accessories |
Stage micrometer |
| Detectors | |
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Customer-swappable detectors |
High-sensitivity MCT-A (7800–650 cm⁻¹) recommended |
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Wider-range MCT-B (7800–450 cm⁻¹) |
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TEC-MCT (7800–1000 cm⁻¹) Does not require liquid nitrogen |
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InGaAs NIR detector (11,700–3,800 cm⁻¹). Requires iS50 with NIR beamsplitter and source |
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Optional detector storage case (PN 840-3885) |
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Fixed detectors |
DTGS |
| ATR and sampling options | |
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ATR (Kinematic mount-based ATR) |
Ge-tip ATR |
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FeelIR diamond ATR |
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Imaging ATR accessory |
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| Sampling handling options | |
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Sample holders |
Universal sample holder |
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General sample handling tools |
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Microcompression cell |
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DC-3 diamond compression cell |
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| Optical and imaging enhancements | |
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Options |
IR polarizers |
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Visible polarizers |
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Fluorescence illuminator |
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Differential Interference Contrast (DIC) optics |
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| Environmental and system options | |
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Windows |
Standard: KBr |
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Optional: ZnSe (Requires replacement by trained service personnel) |
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Humidity and moisture control |
Desiccants |
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Dual-zone purge (spectrometer and microscope) |
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Included items
All configurations come with the following components and accessories required for standard operation.
Refer to the packing list or shipping documentation for the exact contents of your system.
| Item | RaptIR X with Manual Turret |
RaptIR X with Automatic Turret |
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Universal slide holder |
✔ |
✔ |
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Liquid nitrogen thermos |
✔ |
✔ |
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Microscope tool kit |
✔ |
✔ |
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Document package |
✔ |
✔ |
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Software DVD |
✔ |
✔ |
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Performance check plate (standards plate) (Certified plate is available) |
✔ |
✔ |
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15x 0.65 N.A. diffraction limited objective |
✔ |
✔ |
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4X visual objective |
— Not included, but visible objectives can be added. |
✔ |
Microscope toolkit
The included microscope toolkit contains the following items for routine maintenance and operation of the system.

| Item | Description | Item | Description |
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1 |
3mm ball driver hex tool |
2 |
2.5mm t-handle wrench |
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3 |
Needles |
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Pin vise |
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Tweezers |
6 |
White sample putty |
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Curved probe |
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Straight probe |
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Knife with roller blade |
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Microscope slides (A/Sample holder) |
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Multi-fiber fabric |
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Multi-function scale micrometer |
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Surgical blades |
14 and |
Continuum Slide Assortment, including EZ Spot Slide (x2), gold-coated slide, and mirrored slide (x2) |
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Continuum Slide Assortment, including EZ Spot Slide (x2), gold-coated slide, and mirrored slide (x2) |
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BaF2 windows |
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BAF2 windows |
Installation and setup
This section provides an overview of the installation process for the microscope.
Detailed site preparation requirements are provided in the Safety Information and Site Preparation Manual.
The microscope must be installed by qualified personnel following the instructions provided in applicable service documentation. For help moving or re-installing the system, contact Thermo Fisher Scientific support.
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Avoid hazard. Do not lift or move the instrument. If you need to move the instrument, contact Thermo Fisher Scientific to schedule a service visit. Service engineers are trained to safely move the instrument without damaging it. Improper lifting may result in injury or equipment damage. |
Connect electrical components
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Connect the instrument to a properly rated and grounded power source.
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Use only approved power cords and connections.
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Ensure that the power disconnect device is accessible.
Improper electrical connections may result in equipment damage or safety hazards.
Connect the instrument power cable to the DC Power port.

Connect utilities
If required for your system configuration:
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Connect purge gas or ventilation as specified.
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Verify that all connections are secure and leak-free.
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Ensure utilities meet specified requirements.
Refer to the Site Preparation Manual for detailed specifications.
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Avoid hazard. When purging the system with nitrogen, ensure the system is properly ventilated. Purge gas exits the system from the purge outlet and from the body of the instrument. You must ventilate the instrument as well as the purge exhaust. |
Install accessories
Use only approved accessories and compatible components. Ensure all connections are secure before operation.
You may install these accessories yourself:
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The joystick
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Swappable detectors
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ATR attachments
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Sample holders
Other accessories must be installed by qualified personnel only.
Install the joystick
To install the joystick, plug the data cable into the "Joystick" port on the back of the microscope.

Swap detectors
The microscope is compatible with several easily swappable detectors to help you optimize your data collection.
Each available detector is recognized by OMNIC™ Paradigm™ software upon installation and loads its own factory preset settings, but you are free to create your own settings based on your analysis needs.
The detectors are universal and will work on any Nicolet™ RaptIR™ X unit without recalibration. They can also be swapped without shutting the power down.
Always use personal protective equipment (PPE) while handling the detectors.
The available detectors for the microscope are:
| Detector | Description | Spectral Range | Requires Liquid Nitrogen? |
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MCT-A |
Fast, high-sensitivity detector with limited spectral range. |
7,800 - 650 cm-1 |
Yes |
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MCT-B |
Fast detector with 20-30% less sensitivity compared to MCT-A, but a wider spectral range for low-frequency vibrations, ideal for work with polymers and other inorganic materials. |
7,800 - 450 cm-1 |
Yes |
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InGaAs |
Specialized near-infrared detector with high spectral range, ideal for pharmaceuticals. Note that the InGaAs detector requires a CaF2 or XT-KBr beamsplitter configuration (preferably the former) in order to function correctly. This is configured at the time of purchase. |
11,700 - 3,800 cm-1 |
No |
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TEC-MCT |
TE-cooled, lower sensitivity detector. Does not require liquid nitrogen. Please allow up to one minute to bring this detector to temperature. |
7,800 - 1,000 cm-1 |
No |
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Avoid hazard. Make sure the detector dewars are empty before you move them. Do not attempt to remove a detector with any liquid nitrogen in the dewar. |
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Avoid hazard. Do not let anything fall into the detector chamber when the lids are open. |
To install a swappable detector
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Open the top hatch of the microscope. If it is locked, turn the main latch to the "unlocked" position to open it.
If there is a detector already inside, uninstall it by following the instructions in "To uninstall a Nicolet™ RaptIR™ X swappable detector."
Figure 2. Top hatch, closed and open
Figure 3. Latch: locked position and unlocked positionOMNIC™ Paradigm™ software checks for a detector in five second intervals. It is not possible to begin a data measurement session without a detector installed. If this occurs, a pop-up will appear as a warning.
Figure 4. Detector missing pop-up box in OMNIC™ Paradigm™ software -
Lift your chosen detector by the handles and place it into the receptacle. Guide the detector in gently until you reach the bottom; do not drop it in.
Figure 5. Lifting / inserting a detector -
When the detector is in, turn the two smaller latches to the "locked" position until tight to secure the detector onto the unit.
Figure 6. Detector latch -
Close the top hatch and turn the main latch to the "locked" position
Figure 7. Top latch (locked) -
(Optional) The top hatch includes a liquid nitrogen fill port for detectors that require it. To fill the port, refer to "Cool your detector."
Figure 8. Dewar fill port (closed, open)
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Do not attempt to remove a detector during a data measurement session in OMNIC™ Paradigm™ software. Doing so will automatically close and interrupt your session. |
To uninstall a swappable detector
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Open the top hatch of the microscope. If it is locked, turn the main latch to the “unlocked” position in order to open it. (Wait until the dewar is empty before removing the detector.)
Figure 9. Open latch with detector inside
Figure 10. Latch: locked position and unlocked position -
Inside, turn the two smaller latches on the detector to the "unlocked" position.
Figure 11. Unlocked detector latches -
Lift the detector by its handles to remove it from the receptacle, then place it in a safe location on a flat, even, unmoving surface.
Figure 12. Lifting and inserting a detector -
Close the top hatch of the microscope (or insert a new detector), then turn the main latch to the "locked" position.

To best protect your detectors, store them in the optional detector storage case (part number 840-388500).
Optimizing a swappable detector
It is important to optimize your detectors to ensure the quality of your spectral data. OMNIC™ Paradigm™ software will alert you with a yellow system status icon (
) when optimization is recommended. Optimization will set the system gain to improve sensitivity while ensuring that the signals do not saturate the detector.
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If you are using a liquid-nitrogen-cooled detector, wait for it to cool before performing optimization. Refer to Cool the detector for more information. |
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Optimization should be done with the correct default source and beamsplitter installed. If the optimization fails because the correct configuration is not available for other reasons, it does not necessarily indicate a problem or prevent the use of your system. |
Click the status icon in the upper-right hand corner of the screen for status details. If there is a yellow icon next to Not optimized, you should optimize your detector.
To optimize your detector
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Go to Acquire Data > Diagnostics > Optimize Detector.
Figure 13. OMNIC™ Paradigm™ software Optimize Detector path -
Follow the on-screen prompt and wait for the process to complete.
If the status turns green, you have successfully optimized your detector. If the status remains yellow, you may need to optimize again or contact support for help.
Insert sample holders
Sample holders slide into the recessed slot on the microscope stage. Some sample holders have a red position indicator which should be aligned with the indicator on the stage.

System integration
If the microscope is integrated into a larger system, the safety of the overall system is the responsibility of the system integrator.
Ensure that all components are compatible and that any additional hazards are identified and mitigated.
Configure the system as an emission source
Coupled with an iS50 spectrometer, your microscope can be configured for right-side emission (RSE) operation with a "passport synchro" in order to allow your microscope to analyze emitter samples.
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Avoid eye hazard. Light emitted by the sample has a path to the eyepiece. If your sample emits hazardous light, please take appropriate precautions to ensure no one uses the eyepiece while the sample is emitting. |
To enable right-side emission measurements, the microscope must be attached on the right side of a Nicolet iS50 spectrometer, which must be equipped with the passport synchro option. The data will be collected using the detector in the iS50, not the microscope detector. As such, this setup directs the beam from the microscope "backwards" to the spectrometer, where it will be modulated and detected.
To analyze using right-side emission
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Open OMNIC™ Paradigm™ software and go to Connectivity > Nicolet iS50 to connect to the spectrometer. Then go to Configure > Sample Location > Main Compartment.
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In the dashboard, set the Source setting to Right collimated. This will move the spectrometer’s internal mirrors to allow the beam to properly travel for right-side emission.
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Use the joystick to focus and center your sample. To change objectives, select camera view on the toolbar and select your desired objective in the virtual controls.
Initial startup
After installation:
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Power on the spectrometer and the computer.
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Verify that indicators and controls function as expected
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Confirm that the system initializes without errors
If the system does not operate as expected, refer to the troubleshooting section or contact support.
Turn the microscope on
If your microscope is connected to an FTIR spectrometer, ensure the spectrometer is powered on before powering on the microscope.
To turn the microscope on, press the power button on the front panel. The blue indicator light blinks during initialization and shows a continuous blue glow when the microscope is ready to use.

Power on the computer
Turn the computer on and wait for the Windows sign-in screen to appear.
Start OMNIC Paradigm software
Use OMNIC™ Paradigm™ software to control the microscope and analyze your sample.
When you first start the software and turn on the microscope, if your system has an automated stage, the software checks the limits of the stage movement to ensure that everything is operating correctly.
To start OMNIC™ Paradigm™ software and connect to the microscope
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Start OMNIC™ Paradigm™ software.
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If the software is connected to the microscope already, the instrument status displays a green checkmark and Nicolet™ RaptIR™ X. The name will differ depending on your instrument configuration.

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If the software is not already connected to the instrument, connect now.
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Go to Configure > Connectivity and select the spectrometer. Click Connect.
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To switch to the microscope options, go to Configure > Sample Location > Microscope. The dashboard changes to show microscopy tools. To switch back to spectroscopy tools, change the sample location back to another accessory or module on your main spectrometer.
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Cool the detector
If your microscope is using a liquid nitrogen cooled detector, ensure it is properly cooled before use.
For more information on the detectors available to you, refer to Swap detectors.
The liquid nitrogen dewar holds 1 liter of liquid nitrogen. When cooled according to the following procedure, the detector should remain cool for approximately 18 hours.
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Avoid freeze burns. Liquid nitrogen is extremely cold and therefore hazardous.
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To refill the liquid nitrogen dewar
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Open the dewar cover and remove the plastic stopper from the dewar.
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Insert the funnel into the detector dewar and pour the liquid nitrogen slowly into the funnel. (A small amount of liquid nitrogen may spill out of the funnel. This will not harm your instrument.) Then let the liquid nitrogen drain completely two or three times. Wait until the vapor plume disappears and repeat until the dewar is filled. Continue to slowly fill the funnel until 1 liter of liquid nitrogen is consumed, or until nitrogen bubbles under the funnel. Stop filling at this point.
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Remove the funnel.
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Wait until the vapor plume disappears, and wait 5 minutes before closing the dewar cover to allow the gasket to thaw.
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Wait 20 minutes, then repeat the procedure to make sure the dewar is filled.
Verify instrument setup
Before using the instrument, verify that the installation was successful and that the system is operating correctly.
To verify the instrument setup, check the system status and run a performance verification workflow.
Check the system status in the software
The system status icon displays information about your instrument and software services. The status icon is shown in the upper-right corner of the screen.
| Icon | Security Suite icon | Description |
|---|---|---|
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The system is connected and all services are running correctly. You are ready to measure and save data. Click the system status icon to view details about the system. |
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A yellow icon means there may be a problem with the instrument, such as the following:
Click the system status icon for more details about the problem. Also visually inspect the instrument and connection. |
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There is a problem with one or more software services. Click the system status icon for details. If the service does not start automatically after a few minutes, restart the computer. |
If you continue to have trouble with system status errors, contact customer support.
Verify system performance with workflows
Check the performance of your microscope by running the qualification or performance verification (PV) workflows. These workflows use an established standard sample to check performance of the instrument. Each test follows different regulatory standards.
PV and qualification workflows use the polystyrene standards plate to test the microscope’s performance.
To run a qualification or performance verification workflow
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From the dashboard, select the Workflows tab.

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Right-click the workflow and select Run.
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Follow the on-screen prompts.
When the workflow is complete, the final reports are added to the Reports pane in the dashboard and can be printed.
| Test | Description |
|---|---|
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Nicolet RaptIR - CP Qualification |
Executes the qualification tests for the RaptIR as defined in the Chinese Pharmacopoeia. |
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Nicolet RaptIR - Factory ATR Qualification |
Runs factory recommended tests and all qualification tests using the ATR accessory. |
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Nicolet RaptIR - Factory Qualification |
Runs factory recommended tests and all qualification tests. |
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Nicolet RaptIR - InGaAs PV Test |
Measures the basic performance of the RaptIR configured with the InGaAs detector based on factory recommended tests. |
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Nicolet RaptIR - JP Qualification |
Executes the qualification tests for the RaptIR as defined in the Japanese Pharmacopoeia. |
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Nicolet RaptIR - PHEUR ATR Qualification |
Executes the qualification tests for the ATR accessory on the RaptIR as defined in the European Pharmacopoeia. |
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Nicolet RaptIR - PHEUR Qualification |
Executes the qualification tests for the RaptIR as defined in the European Pharmacopoeia. |
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Nicolet RaptIR - PV Test |
Measures the basic performance of the RaptIR based on factory recommended tests. |
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Nicolet RaptIR - USP Qualification |
Executes the qualification tests for the RaptIR as defined in the US Pharmacopoeia. |
Operation
This section describes how to operate the microscope.
Description of controls and interfaces
The microscope is operated using system controls and software interfaces.
Microscope features

| Label | Feature | Description |
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A |
Trinocular video eyepiece |
The optional trinocular eyepiece provides a visual and a video image in OMNIC™ Paradigm™ software. The monocular eyepiece (not shown) provides only a video. |
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B |
Rotating objective turret |
The turret supports 1 IR objective and 1 visual objectives. Typically, you will use a 15x IR objective and a 4x visual objective. The microscope also supports optional GAO and 40x visual objectives. |
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C |
Motorized stage |
The stage supports a 40 mm working distance and samples up to 5 kg. The automated stage is controlled with OMNIC™ Paradigm™ software or with the optional joystick. The manual stage is controlled along the X and Y axes with the stage control handle and along the Z axis with the software. |
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D |
Condenser |
The condenser focuses the illumination on the sample from below the stage. Adjust the condenser height in the software to optimize the focus of the illumination on the sample. |
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E |
Transmission illumination iris |
Use this field of view iris to adjust the size of the illuminated field of view. It opens and closes concentrically. Typically, the iris is fully opened so that it is out of the full field of view. If a sample surface is uneven, you may find it easier to focus on the edges of the iris blades to find the best focus. |
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F |
Power indicator and button |
Press to turn the microscope on or off. The blue power indicator blinks while the microscope is starting up and stays a steady blue when the microscope is ready for use. |
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G |
Reflection illumination iris |
Use this field of view iris to adjust the size of the illuminated field of view. It opens and closes concentrically with respect to the reticle cross hairs. Typically, the iris is fully opened so that it is out of the full field of view. If a sample surface is uneven, you may find it easier to focus on the area of interest if you first partially close the iris and focus on the edges of the iris blades. |
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H |
Swappable detector hatch and 1-liter liquid nitrogen dewar |
The detector hatch can open to allow swapping of detectors. The liquid nitrogen dewar holds 1 liter of liquid nitrogen. Once cooled, the detector will remain cool for about 18 hours. |

| Label | Feature | Description |
|---|---|---|
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A |
Stage control handle |
Use to move the manual stage long the X and Y axes. |
The stage

| Label | Feature | Description |
|---|---|---|
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A |
ATR sensor |
The ATR sensor detects whether the ATR attachment is installed. |
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B |
Sample slide alignment indicator |
Align the red indicator dots on the stage and the sample slide. |
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C |
Control stage orientation |
Used to rotate the stage during installation. Do not adjust after installation. |
Connections

| Label | Description |
|---|---|
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A |
USB 3.0 connection to computer’s USB 3.0 port |
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B |
Connection to the optional joystick |
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C |
Connection to the Auxiliary Signals port on the spectrometer |
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D |
Connection to the Accessory port on the spectrometer |
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E |
Connection to the power supply cable |
Optional joystick
You can use the optional joystick to control the stage position and sample illumination. The stage and illumination can also be controlled in the software.
To connect the joystick, plug the data cable into the "Joystick" port on the back of the microscope.

| Label | Feature | Description |
|---|---|---|
|
A |
Transmittance illumination control |
Rotate to manually dim or brighten transmittance illumination. |
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B |
Reflectance illumination control |
Rotate to manually dim or brighten reflectance illumination. |
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C |
Joystick for stage control |
Push the joystick forward, backward, left, or right to move the stage along the sample plane. Rotate to move the stage up or down. |
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D |
Speed control |
Controls the speed of the stage for precise, slow movement, or fast movement. |
Optional trinocular eyepiece
Your microscope may have either a monocular eyepiece with only the camera or it may have the trinocular eyepiece with the camera and visual eyepieces.

| Label | Feature | Description | ||
|---|---|---|---|---|
|
A |
Visual eyepieces |
Adjustable eyepieces for looking at the sample. Best used with the optional joystick. |
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B |
Three-position view selector |
Controls the light path for the eyepieces.
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C |
Camera |
The USB camera is operated with OMNIC™ Paradigm™ software. |
Overview of the OMNIC Paradigm software
Run your microscope and analyze your samples using OMNIC™ Paradigm™ software, Thermo Scientific’s streamlined material analysis software. The user-friendly dashboard screen helps you view instrument status and recent work, process your spectra, conduct multi-component searching, and create new libraries. Designed with lab managers and science educators in mind, this software helps automate workflows using an intuitive drag-and-drop workflow creator. Work remotely and collaborate with colleagues around the globe when you upload OMNIC™ Paradigm™ data to the cloud using the Thermo Scientific™ OMNIC™ Anywhere application.
Interface
When working in microscopy, you will primarily work in the dashboard and the microscope tab.
Dashboard
Begin a new session, edit measurement settings, view recent measurements, reports, and sessions, and view workflows on the dashboard. The measurement settings change somewhat when the sample location is set to a microscope.

| Label | Feature | Description |
|---|---|---|
|
1 |
Command area |
This area features the main menus, toolbar, tabs, and the system status.
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2 |
Dashboard tabs |
The dashboard has three sections:
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3 |
Basic settings |
This area includes basic measurement settings and background settings for individual measurements. This is also where you can start a new microscope tab to begin your analysis. |
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4 |
Mapping session settings |
These settings are specific to mapping sessions. The are used only when you begin a session. |
|
5 |
Advanced settings |
These more advanced settings control additional microscope components and less-commonly used data collection settings. |
The microscopy measurement and microscope tab
When your sample location is set to a microscope, select Start to open a new microscope tab.

| Label | Toolbar | Description |
|---|---|---|
|
1 |
Command area |
As on the dashboard, this area includes the main menus and an updated toolbar for microscopy tools. |
|
2 |
Settings pane |
The settings pane includes all the same settings available on the dashboard. You can edit your settings here or on the dashboard. |
|
3 |
Mosaic panel |
This is the main workspace when working in a microscope tab. It shows the currently collected mosaic image of your sample. If you are using a manual stage, this pane is hidden since mapping is not supported. |
|
4 |
Spectrum panel |
The spectrum pane displays your most recent measurement or the live spectrum. |
|
5 |
Camera view |
The camera view shows a live image of the sample and includes tools for adjusting the stage and camera. Tabs in the camera view include tools for adjusting the camera view and stage position. If you install the ATR attachment, this is where you will find the ATR sensor status and controls for the ATR attachment. Select the small spectrum icon to toggle the camera view and the spectrum pane. The spectrum pane shows your collected background and sample measurements. |
Visible and IR light beam paths
It is useful to understand how various components of the microscope interact with the visible and IR light as it passes through the system. These diagrams are intended to help you understand the flow of light through the system and how options in the software affect the visible and IR light.
The following images show a simplified diagram of the light paths through the microscope. The first image shows the light paths for all analysis modes. The next images show the light paths for reflection and transmission analysis modes.

| Component | Label | Description |
|---|---|---|
|
Reflection group |
||
|
A |
Reflection illumination |
The reflection illumination is used for reflection analysis. The light is reflected off the sample and into the objective and camera. |
|
B |
Reflection aperture wheel |
The reflection aperture wheel controls the size of the illuminated area for reflection analysis. It opens and closes concentrically. This is controllable only using the control wheel on the instrument. It is not controllable in the software. |
|
C |
Polarizer - Visible |
This polarizer is used to control the polarization of the visible light for reflection analysis. It is paired with the visible light analyzer. |
|
IR Group |
||
|
D |
IR source |
The IR source provides the IR light for all analysis modes. The IR light is directed through the system and interacts with the sample in different ways depending on the analysis mode. The source is either a connected FTIR spectrometer or the RaptIR X SAM. |
|
E |
Polarizer - IR |
This polarizer is used to control the polarization of the IR light. It is paired with the IR analyzer. |
|
Transmission group |
||
|
F |
Transmission illumination |
The reflection illumination is used for transmission analysis. The light is transmitted through the sample and into the objective and camera. |
|
G |
Transmission aperture wheel |
The transmission aperture wheel controls the size of the illuminated area for reflection analysis. It opens and closes concentrically. This is controllable only using the control wheel on the instrument. It is not controllable in the software. |
|
H |
Polarizer - Visible |
This polarizer is used to control the polarization of the visible light for reflection analysis. It is paired with the visible light analyzer. |
|
Microscope core |
||
|
I |
Condenser |
The condenser focuses the illumination on the sample from below the stage. Adjust the condenser height to optimize the focus of the illumination on the sample. The condenser is used only in transmission analyses. |
|
J |
ATR attachment |
The ATR attachment connects to the 15x objective and allows you to perform ATR analysis. When the ATR attachment is installed, the ATR sensor detects its presence and the software automatically adjusts the light paths for ATR analysis. |
|
K |
Objective |
The objective focuses the light onto the sample and collects the reflected or transmitted light from the sample. The microscope supports a 15x IR objective and a 4x visual objective. Optional GAO and 40x visual objectives are also available. The ATR attachment connects to the 15x objective. |
|
Imaging group |
||
|
L |
Analyzer - visible |
This analyzer is used to control the polarization of the visible light for reflection and transmission analysis. It is paired with the visible light polarizer. |
|
M |
Camera / Eyepiece |
The camera or eyepiece is used to view and capture images of the sample. |
|
IR Detection group |
||
|
N |
IR analyzer |
This analyzer is used to control the polarization of the IR light. It is paired with the IR polarizer. |
|
O |
Aperture |
This blade aperture can be rotated and resized to best fit the sample area of interest. It is used in all analysis modes and is controllable in the software. Adjusting the aperture changes the size of the area being analyzed and can help to optimize the signal-to-noise ratio for your sample. |
|
P |
Detector |
The detector converts the IR light into a digital signal that can be processed by the software. |
Reflection analysis
When you set the "Analyze using" setting to Reflection or ATR, the visible and IR light pass through the objective, bounce off the sample surface, and return through the objective to the detector.

Transmission analysis
When you set the Analyze using setting to Transmission, the visible and IR light pass through the sample. The condenser focuses the illumination on the sample from below the stage. The light is transmitted through the sample and into the objective and camera.
If desired, you can still use the reflection illumination in transmission analysis. The reflection illumination can be used to enhance the visible light for better camera viewing and focusing.

Sample handling
Proper sample handling is essential for safe and accurate operation.
-
Use only compatible samples and materials
-
Avoid hazardous or incompatible substances unless proper precautions are in place
-
Follow laboratory safety procedures
Some materials may produce hazardous vapors or byproducts under certain conditions.
Measure a sample
Use OMNIC™ Paradigm™ software to operate the microscope and to analyze samples. This section describes a basic measurement process using Reflection or Transmission analysis.
For detailed information on measurement settings and software controls, refer to the OMNIC™ Paradigm™ software user manual.
Before you begin
Verify the following:
-
The sample is prepared.
-
The software is running.
-
The instrument is ready
Load the sample
Eject the stage so that you have more access to the stage to position your sample. If your sample is small and fits in position easily, you can position the sample without ejecting the stage.
To load the sample
-
In the software, click Eject Stage. Ejecting the stage lowers the stage to make it easier for you to load a sample. If you have a manual stage, lower it using the joystick or software controls.
-
Insert the sample slide. The stage fits a universal sample holder.
Figure 19. Sample insert
View the sample
Click Start to open a new Microscope tab and view your sample. In the Microscope tab, the camera view shows a live image of the sample. Use the camera tools or the optional joystick to adjust the illumination and bring the sample into focus.
Locate and light the sample
Use the camera view or optional joystick to adjust illumination and bring the sample into focus. For detailed instructions on illumination and focus controls, refer to the OMNIC™ Paradigm™ Software user manual.
To light and focus automatically
-
Open the camera view and open the Focus settings tab.
Camera view focus settings
-
Select Autofocus. The software moves the stage up and down to find the optimal focus. Autofocus works best with areas of high visual contrast. Autofocus may struggle with some low-contrast samples and samples with multiple focal planes. Autofocus also automatically lights the sample.
Optional: capture a mosaic
A mosaic is a collection of pictures of the sample that are stitched together into a single large image. The mosaic serves as the main workspace for navigating the sample and identifying areas of interest.
Systems with a manual stage cannot capture a mosaic. Use the camera view to navigate the sample.
Before you capture a mosaic, make sure that the sample is in focus and illuminated.
To capture a mosaic
-
Select the Draw Mosaic tool from toolbar.
-
Click and drag on the mosaic pane to draw a mosaic region.
-
Select Capture Mosaic.

Measure the background and sample
Review your measurement and background settings in the left panel.
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Select Live Spectrum to continuously view the single beam spectrum as move around the sample. This can help you determine if you want to use a particular point for your background measurement. If you select this option, the software displays a live single beam spectrum in the spectra pane. |
To measure a background spectrum
-
Move the stage to the reference point for your analysis type.
-
Select Background from the toolbar. When the measurement is complete, the background spectrum is stored in the database and added to the spectra pane.
To measure a sample point
If you have a mosaic, select a point on the mosaic to automatically move the stage to that location.
If you do not have a mosaic, use the camera view or joystick to navigate to the point of interest.
-
Switch to the 15x objective. To change objectives, select Change Objective in the toolbar, in the camera view, select the Objectives tab.
-
Select Sample from the toolbar.
When the measurement is complete, the spectrum is stored in the database and added to the spectra pane. You can now process, identify, and analyze the spectrum. For more information about OMNIC™ Paradigm™ software’s processing and search tools, refer to the OMNIC™ Paradigm™ software user manual.
Measure with ATR
With the optional attenuated total reflection (ATR) attachment, you can analyze highly infrared-absorbant or hard-to-prepare microscopic materials, often with little or no sample preparation. Examples of these materials include polymers, coatings, rubbers, coated papers, and biological materials.
ATR measurements are not compatible with particle analysis in the software. If you are performing particle analysis, use reflection or transmission techniques instead.
|
The ATR tip may leave a small indentation on the sample surface. This is normal and does not indicate damage to the ATR crystal. |
Applications of ATR microscopy include:
-
Analyzing the surface of a sample.
-
Analyzing highly-absorbing materials and the surfaces of thick samples.
-
Analyzing surface coatings.
-
Analyzing surface defects, inclusions, or degradation.
Installing the ATR attachment
The ATR attachment is held to the objective using magnets. To install the attachment, align the indicator dots on the objective with the dots on the attachment. The recessed spaces on the attachment must line up with the guides on the objective.

| Label | Feature | Description |
|---|---|---|
|
A |
Alignment indicators on the objective |
The objective has three indicators: A single dot, two dots, and three dots. These help you align the attachment correctly. |
|
B |
Alignment indicators on the ATR attachment |
Using these alignment indicators on the attachment, match the single dot on the objective with the single dot on the attachment, the two dots with the two dots, and the three dots with the three dots. This will ensure that the ATR is properly aligned for use. |
|
C |
QR codes |
The ATR sensor reads QR codes on the ATR attachment to automatically recognize which ATR is installed and to recognize the position of the attachment. |
Measure data using ATR
Measuring data with the ATR attachment follows the same processes as other types of measurements. When you set "Analyze using" to ATR, the software prompts you to insert the ATR crystal attachment as needed.
To measure using ATR
-
On the dashboard, select ATR from the Analyze using list.
Analyze using ATR
-
Optional: Review and edit the ATR Contact settings.
-
In the Camera view, select the ATR tab to view the ATR settings.
ATR contact
Setting Description Target pressure
This is the target pressure that will be applied during measurement. Click and drag the slider or enter an exact value.
Release distance
The vertical distance that the stage moves once the ATR contact is released. A larger distance provides more clearance but will cause the ATR measurement to take longer, since the stage will move farther at every point.
Contact
Press to test contact.
Release
Press to release contact.
Profile
Select the settings use to use for the ATR contact and release.
-
-
Measure a background and your sample as normal. The software automatically applies the target pressure during measurement. The software also prompts you when to install the attachment.
The ATR attachment can be used for individual measurements or for measuring regions in a mapping session.
ATR clean check
Run a manual "clean check" in OMNIC™ Paradigm™ software to check the cleanliness of an ATR crystal after completion of an experiment. A comparison is made between a clean sample and a contaminated one, which is captured via peaks in the spectra. As this is a manual process, the ATR clean check involves certain necessary steps that would not be normally required. An eggshell business card would be an adequate sample for this type of check.
The process involves collecting a spectrum of your sample, then releasing the pressure (by raising the crystal off of the sample) and measuring another spectrum. If the crystal has picked up contamination from the sample, such as oil or adhesive residue, the spectrum of the crystal will show residual peaks. This then requires cleaning the crystal.
To run an ATR clean check
-
Place your sample and set your parameters.
-
"Analyze using" must be set to ATR.
-
Set measure background to "After time." Both sample measurements in this procedure should use the same background measurement.
-
-
In a new microscope tab, open the camera view.
-
Select Change Objective to change to the IR capable 15x objective.
-
In the camera view, select the stage tools tab and choose Show Crosshairs to aid in seeing your target.
A message appears at this point if the ATR crystal attachment is not installed. If this occurs, simply insert the attachment and select OK (the option will be unavailable until the attachment is inserted). ATR attachment pop-up message
-
Under the ATR tab, set the target pressure and release distance. The suggested settings for the purposes of the check are a target pressure of 50 and a release distance of 3500 microns, but you are free to set different values if preferred. A large release distance ensures that the crystal comes clear of the sample.
-
Measure a background spectrum. You can do this using the Background tool in the toolbar. Measure the background as normal. The ATR crystal should not be in contact with the sample while collecting the background.
-
When the background is complete, select Contact under the ATR Contact menu to manually bring the sample into contact with the ATR. This does not move the stage.
-
Select Sample to measure the spectrum.
-
Select Release under the ATR Contact menu to release the crystal, then select Measure again to obtain a measurement of the crystal itself.
Examine the spectrum from the released crystal. If there are peaks present, it indicates contamination from the sample. Shown here is a residual oil. If the spectrum is essentially flat, you can continue. Otherwise, you should clean the crystal before proceeding.
Residual oil sample
Analyze regions (areas, lines, and points)
With a mapping session, you can measure a collection of points at once.
Mapping is not available on systems equipped with a manual stage.
A mapping session is used to analyze regions. In OMNIC™ Paradigm™ software, a region is an area, line, or point. Regions are measured using identical measurement settings to create a chemical image of the sample. You can measure one or more regions at a time. Measuring regions requires you to first capture a mosaic.
To start a mapping session, in a Microscope tab, select Start Session in the toolbar.
To analyze areas, lines, and points
-
Capture a mosaic. A mosaic is a collection of pictures of the sample that are stitched together into a single large image. The mosaic serves as the main workspace for navigating the sample and identifying areas of interest.
Before you capture a mosaic, make sure that the sample is in focus and illuminated.
-
Select the Draw Mosaic tool from toolbar.
-
Click and drag on the mosaic pane to draw a mosaic region.
-
Select Capture Mosaic.
-
Measure a background spectrum, as required by your settings.

-
-
Specify regions to analyze. You can add multiple regions to a single analysis.
To Analyze Select this tool Perform these steps Areas

-
Select the area tool.
-
Click and drag on the mosaic to draw the area.
Lines (Not available when using the polarizer during IR data collection)

-
Select the line tool.
-
Click and drag on the mosaic to draw a line.
Points

-
Select the point tool.
-
Click to add a point.
Use the pan tool to select or delete areas, lines and points.
-
-
Open the Region Queue to view and refine details for all areas, lines, and points in your measurement. You can also select a background measurement to associate with each region.
-
When you are finished adding regions, click Measure Regions.
Analyze particles
Use the Particle Analysis tools to locate, characterize, and identify particles.
![]() |
Particle analysis is not compatible with ATR measurements. To perform particle analysis, use reflection or transmission techniques. |
To analyze particles
-
Prepare your sample.
-
On the dashboard, in the Mapping Session settings, select Analyze particles.
Figure 20. Analyze particles checkbox -
Start a session.
-
Bring the region of interest into focus and capture a mosaic.
-
Measure a background spectrum as required by your settings.
-
From the toolbar, select Particle Analysis in the toolbar and draw a rectangle around the area of interest. The software detects particles in the region and gives you options to refine your selection.
Figure 21. OMNIC™ Paradigm™ software particle analysis setup-
Refine your selection using the options and selection tools. Select Recalculate after updating settings to update the particles.
Refer to the OMNIC™ Paradigm™ guides and tutorials for detailed explanations of the particle analysis tools and settings.
-
When you are satisfied with your selection, click Accept. This saves the selection settings but does not yet measure the data.
-
Click Measure Regions.
-
When the measurement is complete, the software displays information about each particle.
Next steps
Explore the OMNIC™ Paradigm™ software user manual for detailed instructions on how to work with your particle data, including how to:
-
Apply profiles to visualize properties of the sample data.
-
Apply processing to selected spectra.
-
Create reports or export data.
-
Explore spectra further in the Spectra view.
Use optional accessories
-
Use only approved accessories and components
-
Ensure accessories are properly installed and configured
-
Follow instructions provided with each accessory
Improper use of accessories may result in unsafe operation or inaccurate results.
Infrared and visible polarizers
Microscopes with the polarizer options include separate polarizers for visible and for infrared light.
For each light source, the microscope includes two polarizing filters called the polarizer and the analyzer.
-
Polarizer: Positioned between the light source and the sample
-
Analyzer: Positioned between the sample and the camera or eyepieces and between the sample and the detector
When using the polarizer, you can insert either the polarizer alone (for plane-polarized light) or the polarizer and the analyzer (for cross-polarized light).
Using the polarizers and analyzers
To use the polarizers, start by opening a new Microscope tab.
-
Settings for the visible light polarizer and analyzer are in the Camera view.
Figure 22. Visible light polarizer settings in the Camera view -
Settings for the IR polarizer and analyzer are in the IR Polarizer tool in the toolbar.
Figure 23. IR polarizer settings in the IR Polarizer tool
To use the visible light polarizer and analyzer
-
Start a microscope tab.
-
Open the camera view and go to the Polarizer tab.
Figure 24. The polarizer tab in the camera view -
Select Enable to insert the polarizer and analyzer into the beam path.
View the sample image in the camera view while you adjust the visible light polarizer settings.
To use the IR polarizer and analyzer
-
Start a microscope tab as usual.
-
Switch to the 15x, IR-capable objective lens.
-
In the toolbar, select IR Polarizer to open the IR Polarizer tool.
Figure 25. IR polarizer settings in the IR Polarizer tool -
Select Enable to insert the polarizer and analyzer into the beam path.
To preview your polarizer settings, select Live Spectrum to view the live spectrum before measuring the sample.
When you are in a session, you can automatically rotate the analyzer and measure the sample at each angle. To use the automatic rotation, you must enable the IR analyzer, set a starting and ending angle, and enter a step size and number of steps.
To rotate the analyzer automatically during the measurement
-
Select Automate rotating acquisition in the IR Polarizer tool to set up an automated measurement sequence.
-
Enter the total number of steps or the degrees per step. These values are linked.
-
Continue your measurements as usual. During the measurement, the software measures the sample with the analyzer rotated at each position.
Grazing angle objective (GAO)
The grazing angle objective (GAO) is an optional, factory-installed addition for the Nicolet™ RaptIR™ X microscope that allows for analysis of ultra-thin film samples on reflecting surfaces. Using the GAO is similar to using other IR objectives but differs in several ways due to its specialized design.
|
Because of its narrower depth of focus, you must always bring the sample into focus manually when using the GAO, and you must never use the Autofocus feature. The grazing angle objective is very tight, so the mirror head needs to be closer to the sample than normal. This lack of space is correct and expected, but brings a risk of scraping the sample while moving the stage. Be careful not to bump the objective onto the sample during collection. You do not need to use the illuminator when working the GAO. The extra light is not necessary and the cable might get tangled with the objective during rotation. |
To collect data with the GAO
-
Load a sample. In the dashboard, set Analyze using to Reflection.
The GAO works best with ultra-thin coatings on reflecting surfaces, such as a gold mirror.
-
Prepare your measurement settings.
Before you select Start or open a microscope tab, deselect Autofocus. Never use Autofocus while using the GAO.
-
Capture a mosaic, if desired.
Start your session as normal. Collect a 4x mosaic, then a 15x mosaic if needed.
-
In the toolbar, select Change objective to switch over to the grazing angle objective.
-
Change the GAO focus. With the software or the optional joystick, use fine movements to adjust the stage height.
-
Select Live Spectrum from the toolbar to see the IR signal in real time.
-
Use the IR signal to determine when the sample is in focus.
-
-
Measure a background and your sample.
-
If desired, start a session and measure regions.
Collect your sample as usual.
Be careful not to bump the objective onto the sample during the measurement. Sampling large areas or point that are particularly far apart increases this risk.
If you were using a session, to avoid the risk of collision between the objective and the sample during rotation, move the stage down before ending the session.
Differential interference contrast optics
Your microscope can be configured with differential interference contrast (DIC) capabilities.
DIC is an optical technique that uses Wollaston prisms and crossed polarizers to enhance contrast and visibility in otherwise transparent samples, such as layered laminates, unstained biological samples, or certain polymers.
Performing DIC is only possible if your microscope has been specifically configured with that capability by Thermo Fisher Scientific. For more information, contact us.
![]() |
The DIC technique can only be used in Transmission mode. Additionally, the DIC optics will only work with the 15x IR-capable objective and condenser. |
To perform DIC
-
Illuminate and bring a sample into focus, then capture a 15x mosaic. When the reflection and condenser image are properly focused, the view will show a bright light.

You can use the manual iris on the lower right side of the microscope; when the condenser is at the proper focus, the edges of the iris will appear sharp. -
Select the polarizer function on the right end of the camera view menu. Turn on the visual polarizer and enable the analyzer (you will need the analyzer). Set the polarizer to 90° and the analyzer to 180°.
The camera view should go dark, indicating that the polarizers have been crossed at a 90° angle.
-
Gently place the first Wollaston prism into the bottom slot near the base of your unit.
The prism may require firm pressure to insert. It should fit firmly and go all the way in until there is resistance.
Figure 26. Insert Wollaston prism into base slot -
Loosen the microscope nose piece thumbscrew. This will allow the second Wollaston prism to slide past the indentations. Slide the prism into the nose piece (indent side up) until it stops, then secure the prism by gently tightening the thumbscrew.
Figure 27. Insert Wollaston prism into the nose piece slot -
Inserting the DIC optics into the microscope will darken your sample image. To remedy this, increase illumination in the software (turning it up to 5 is recommended).
-
Use your fingers to rotate the Wollaston prisms and manipulate the sample image. This will result in visible color changes to give you higher visibility of your sample with a three-dimensional effect. You can also record mosaics or single frame captures of the resulting image.
Figure 28. Wollaston prisms rotation
Fluorescence illuminator
Your microscope is compatible with a fluorescence illuminator designed to locate and illuminate portions of a fluorescent sample that are of interest.
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The fluorescence illuminator is to be used to locate points of interest in a sample. It is not, in itself, used to collect or measure data. |
The fluorescence illuminator can be installed only by a Thermo Fisher representative. For more information, contact us.

|
A |
Rotating mount: Used to switch to different illumination frequencies if needed. |
|
B |
Shutter: Switch on or off to block the light or allow it through. |
|
C |
Optics and apertures: May also be used to manipulate the flow of light. |
|
D |
Illuminator lamp: Positioned near the back of the instrument. |
To illuminate your sample with the fluorescence illuminator
-
Center your sample using the OMNIC™ Paradigm™ software camera view.
Start with a 4x objective for a wider area view. This allows you to find the sample’s fluorescent locations more easily.
Figure 30. Centered sample (dyed fluorescent polystyrene beads) using 4x objective and blue excitation. One bead is seen fluorescing. -
Once you have centered your target, select Change Objective to switch to the 15x objective. You will see a much brighter image of your sample and points of interest.
Figure 31. 15x Change Objective option -
Focus on the sample as needed.
Figure 32. Centered sample (dyed polystyrene beads) using 15x objective.The bead in the example is now much brighter. No change was made to the fluorescence illumination. A second nearby bead is also visible now.
-
Close the shutter (shutting off fluorescence) when you are ready to measure data. You may use the microscope’s regular illuminator as needed at this point.
Figure 33. Dyed polystyrene beads using 15x objective (closed shutter)
Linkam stage
Your microscope supports the use of a Linkam™ stage to let you analyze samples in an environmental chamber. In this configuration, the standard stage is removed and the Linkam stage is installed directly on the dovetail mount.
|
Before you begin operations, wait three to five minutes for the LVDT to initialize after you turn on the microscope. |
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This configuration is fixed and does not allow for X-Y movement of the Linkam stage. |
Inserting and removing the Linkam stage
The Linkam stage configuration is installed and assembled by a Thermo Fisher representative, but you have the ability to remove the stage and reinsert it as needed to swap between stages. If you have any questions not covered by these instructions, contact us.
To insert the Linkam stage
-
Remove the standard stage if it is currently mounted. (Refer to "Inserting and removing the standard stage".)
-
Ensure that the Linkam stage is sitting flat on the dovetail mount and line up the alignment pins on the bottom of the stage to the to the holes in the mount, then push down. If the stage is correctly lined up, it snaps down with minimal force.
-
Tighten the front knob with your hand, finger-tight, to secure the stage.
Figure 34. Front stage knob -
Configure the Linkam stage. Go to Configure > Instrument > Microscope and select RaptIR with Manual Stage. Then restart OMNIC™ Paradigm™ software.
Figure 35. OMNIC™ Paradigm™ software Microscope option
Figure 36. Configure Microscopes - manual stage option
To remove the Linkam stage
-
From the OMNIC™ Paradigm™ software dashboard, set Analyze using to Reflection or ATR. Doing this drops down the condenser, giving you the space you need to remove the stage.
Figure 37. Condenser up
Figure 38. Condenser drop -
Loosen the front knob with your hand (counterclockwise).
Figure 39. Front stage knob -
Remove the Linkam stage. If it is sufficiently loosened, it should snap out of position with an audible pop. If you cannot remove the stage, simply loosen the knob further.
Figure 40. Removing the Linkam stageTo best protect your Linkam stage when not in use, store it in a secure location in its original packaging, if available. You may leave the black mounting ring attached.
Inserting and removing the standard stage
You can reinstall the standard Nicolet™ RaptIR™ X stage as needed when you do not have use for the Linkam stage.
To insert the standard stage
-
Use a Phillips screwdriver to open the side cover on your microscope.
Figure 41. Side cover removal
-
With the cover removed, connect the standard stage cables. The cables and connectors are male and female, so they cannot be installed backwards. Once connected, use a small flathead screwdriver to tighten the cable set screws. Do not over-tighten.

-
Take the standard stage and align it onto the dovetail mount (make sure the front stage knob is properly loosened), then press it down. The stage will pop into place.
-
Secure the stage by tightening the front knob, finger-tight, until secure.
-
To configure the standard stage, go to Configure > Instrument > Microscope and select RaptIR.
Close and restart OMNIC™ Paradigm™ software.
Figure 42. OMNIC™ Paradigm™ software Microscope option
Figure 43. Configure Microscopes - RaptIR optionIf the stage is properly installed and configured, the software asks if you want to initialize the stage. Select OK to continue normal operation.
To remove the stage, simply follow the physical steps above in reverse order or refer to "To remove the standard stage."
To remove the standard stage
-
Loosen the set screws on the connector cables.
-
Disconnect the connector cables.
-
Loosen the front knob on the standard stage.
-
Remove the standard stage by pulling it up and out of position. If you cannot remove the stage, simply loosen the knob further.
Using the Linkam stage
This section describes how to set up a measurement in Transmission mode using the Linkam stage and OMNIC™ Paradigm™ software.
-
Make sure the stage is configured. If not, go to Configure > Instrument > Microscope and select RaptIR with Manual Stage.
Figure 44. Configure Microscopes message -
Use the stage knob to adjust the sample holder ring and bring it closer to the center.
-
Set Analyze using to Transmission.

If the condenser is physically all the way up, you can temporarily set Analyze using to ATR in order to drop the condenser down, allowing you to move the stage. Make sure to go back to Transmission afterward. -
Open the microscope tab and open the camera view.
-
Set your objective to 4x.
-
Use the joystick to turn up illumination and raise the stage. (You can also do this using the virtual controls in the camera view). Do this until you can see the focused image in the camera view.
You see a clear image of the hole and sample holder ring. Move the sample holder ring out of the way to achieve a clear view of the hole.
Figure 45. Hole with sample holder ring
Figure 46. Clear image of hole
At this point, do not use the Z-axis controls as doing so will defocus your image. -
Switch to the 15x objective. The screen goes dark.
-
Select the Condenser option and set it to about 40,000. You will see light from the Transmission illuminator.
-
Turn the Reflectance illuminator all the way down.
-
Using the lower iris control knob to the right side of the stage, close the iris slightly. The iris edges indicate when you are in focus. Be sure to use the lower iris knob and not the one on the top.
-
Focus the condenser image until the edges of the iris become clear and sharp.
Figure 47. Focused iris condenser image
At this point, do not manipulate the objective or condenser. -
Select Show Crosshairs in the camera view. This step is optional, but it shows the precise location where the system will perform its analysis.
-
You are now ready to insert your sample and measure data as normal.

You may move your sample in the x and y directions using the micrometers on the Linkam stage. Do not adjust the Z location as this will defocus the system. The x and y joystick options will have no effect.
Maintenance
This section describes routine maintenance tasks for the microscope.
Only the procedures described in this section should be performed by the user. All other service must be performed by qualified personnel.
Cleaning the instrument
If you wish to remove dust from a mirror, window, or optical component, blow it off with a dust blower. Wipe the exterior of the system with only a clean, dry cloth.
-
Do not use canned air or duster, which may damage the instrument.
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Never allow any liquid to come into contact with a window or optical component.
Replacing the desiccant
The desiccant protects the instrument from moisture whenever the purge is unavailable or the instrument is not in use.
Replace the desiccant if either of the following occurs:
-
The humidity indicator is turning white or is pink.
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The instrument software reports humidity above 40%.
Important: Use only replacement desiccant supplied by Thermo Fisher Scientific.
Before you begin
Required materials:
-
RaptIR SAM desiccant replacement kit (Part number: 714-316100)
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#2 Phillips screwdriver (optional)
Check the humidity indicator
-
Look through the inspection window on the side of the SAM.

-
Check the humidity indicator.
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Blue - The desiccant is still good.
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White or pink - Replace the desiccant and the humidity indicator.
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Replace the desiccant and humidity indicator
To replace the desiccant
-
Remove the flexible black cover.

-
Loosen the two captive thumb screws.

-
Use your fingers or a Phillips screwdriver to loosen the captive thumb screws.
-
Loosen the bottom screw first.
-
While loosening the top screw, support the handle so the cover does not drop.

-
-
Pull the desiccant cover out.

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Remove both desiccant packs.

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Install two new desiccant packs.
Tuck the packs against the sides of the compartment so they stay in place.

-
Replace the humidity indicator.

-
Lift the spring clip.
-
Slide out the old indicator.
-
Slide in the new indicator with the printed side facing out.
-
-
Replace the desiccant cover.

-
Hold the cover by the handle while positioning it.
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Tighten both captive screws
-
-
Reinstall the flexible black cover.
Verify the replacement
Allow the instrument to reach equilibrium before evaluating the humidity.
Monitor the humidity indicator and the humidity reading in the software until the humidity stabilizes. The humidity indicator should remain blue, and the software should report humidity below 40%.
Maintaining the liquid nitrogen dewar (if applicable)
The detector dewar should maintain its insulating vacuum for several years. If the vacuum is lost , the insulation will lose effectiveness and the following symptoms may occur:
-
Shortened hold times and condensation (liquid nitrogen boils off much faster than usual)
-
Water and atmospheric contaminants condensing on the detector window will show up in spectra as unwanted peaks
-
Note that water condensation may also appear during normal detector cooling in high-humidity environments
|
If your instrument shows any of these symptoms, the detector dewar may have a vacuum leak. Contact us immediately for assistance. |
Storing and shipping the detector
Your detector can degrade over time, resulting in performance issues and the need to re-pump the dewar.
This section includes instructions on how to store and ship your detector to Thermo Fisher for re-pumping, service, and maintenance. A general recommendation is to get your detectors re-pumped every seven years, though this can vary with usage.
The detector shipping restraints must be reinstalled prior to storing the detector for shipment.
|
|
Avoid hazard. Make sure the detector dewar is empty before reinstalling the restraints. Do not attempt to remove a detector or reinstall the restraints if there is any liquid nitrogen in the dewar. |
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If you are simply storing your detectors on a shelf and do not plan to ship them to Thermo Fisher for service, it is not necessary to reinstall the shipping restraints. Only reinstall the restraints if you plan to ship your detectors for pumping and maintenance. |
If you have lost your detector’s original shipping restraints, contact us to order a replacement.
To reinstall the detector restraints
-
Insert the larger restraint piece into the detector’s dewar fill port and screw it in until snug.

-
Insert the smaller shipping restraint piece into the hole and screw it in until snug.

When both pieces are installed and secure, you are ready to store your detector for shipping.
Contact us (or a Thermo Fisher representative in your area) for details on how to ship your detectors to us.
Detector storage
Store your detectors at room temperature in their originally supplied packaging or the optional detector storage case. Place them on a flat, level surface.
Make sure the detector dewars are empty before storage.
Replacing parts
Use only replacement parts specified by the manufacturer.
Substituting parts with non-approved components may result in:
-
Equipment damage
-
Reduced performance
-
Safety hazards
Replacing power cords
-
Use only power cords that meet the specified ratings.
-
Do not modify or repair power cords.
-
Replace damaged power cords immediately.
Improper power cords may create a safety hazard.
Contacting service
Contact the manufacturer or service provider if:
-
The instrument does not operate as expected.
-
A component appears damaged or worn.
-
Maintenance beyond routine cleaning is required.
Do not attempt to service internal components unless instructed.
Troubleshooting
This section provides guidance for identifying and resolving common issues with the microscope.
If problems persist after troubleshooting, contact the manufacturer or your service representative.
Important safety information
If incorrect operation could result in a hazard:
-
Stop using the instrument immediately.
-
Disconnect power if necessary.
-
Do not attempt repairs beyond those described in this manual.
Only qualified personnel should perform service or repair procedures.
General troubleshooting approach
When a problem occurs:
-
Observe system indicators and messages.
-
Identify any recent changes to configuration or setup.
-
Verify that the system is being used as specified.
-
Check connections, accessories, and environmental conditions.
Use the information below to help identify and resolve common issues.
Common issues and solutions
| Issue | Possible Cause | Solution |
|---|---|---|
|
15x mosaics do not reproducibly align with the 4x image. For example, in the image below, the 15x image is not aligned with the 4x image. images not aligned
|
The objective is loose. |
The objective can sometimes become loose. This usually happens when inserting and removing the ATR attachment. If the objective feels loose, hand-tighten the objective. Do not overtighten the objective. Overtightening the objective will damage it. If the objective feels snug and you are still having alignment issues, contact your service representative. |
|
Sections of the software interface do not fit on the screen. Parts of the display are cut off
|
Your display scaling settings are not compatible with the software. |
If parts of the software interface do not fit on the screen, you may need to adjust the display scaling in your device’s display settings. For example, on some monitors, the Camera tools may not fit on the screen if the display scaling is set to above 100%. For help changing your display settings, refer to Windows™ help information. |
|
The mosaic or camera view are completely black. |
The camera is not connected. The three-position selector on the eyepiece is pushed in, on eyepiece-only mode. |
Verify that the camera cable is plugged into the nose piece. Verify that the microscope USB cable is plugged into the USB 3.0 connector. Pull the three-position selector out to the middle or out position. |
|
The system status shows a yellow or red icon. |
There may be a problem with the instrument or with software services. |
View the System Status for more information. |
When to contact service
Contact the manufacturer or service provider if:
-
The issue cannot be resolved using this section.
-
The system shows signs of damage or malfunction.
-
Repeated errors occur during normal operation.
Provide the following information when contacting support:
-
Product name and model
-
Serial number
-
Description of the issue
-
Any error messages displayed
Appendix A: Labels and markings
This section describes the labels and markings used on the Nicolet™ RaptIR™ X, including their location.
All symbols and labels on the instrument must be understood before operating the system.
General label information
Labels on the instrument provide important safety and identification information.
These labels:
-
Are permanently affixed to the instrument
-
Are designed to be clearly visible during operation and service
-
Must not be removed, obscured, or damaged
If a label becomes damaged or unreadable, contact the manufacturer for replacement.
Label reproductions
Some labels are affixed to the back of the microscope.

Appendix B: Warranty information
Thermo Fisher Scientific warrants that each product we sell is free from defects in labor and materials and shall conform to its product specifications as defined in the product user documentation. If the product does not function as warranted during the warranty period, we will repair or replace it without charge. If, in our judgment, we are unable to do so, you may return it to us and we will refund your money.
This warranty replaces all other warranties, expressed or implied, including the implied warranties of merchantability and fitness for a particular purpose and any other obligations or liabilities on the part of Thermo Fisher Scientific whether in contract, warranty, negligence, or otherwise. Thermo Fisher Scientific shall not be liable for and disclaims all consequential, incidental, and contingent damages.
Warranty period
The system warranty period is 12 months in the U.S.A. and Canada. The warranty period begins on the date of installation or 30 days from the date of invoice, whichever is sooner.
The system warranty period for products sold outside the U.S.A. and Canada is 12 months from the date of installation or 14 months from the date of shipment, whichever is sooner.
Limit of warranty
Misuse, accident, modification, unsuitable physical or operating environment, improper maintenance, or damage caused by a product for which we are not responsible will void the warranty.
Consumables are not covered under warranty.
We do not warrant uninterrupted or error-free operation of a product. We provide certain non-Thermo Fisher Scientific products on an “as is” basis. Non-Thermo Fisher Scientific manufacturers or suppliers may provide their own warranties. A separate software warranty is provided with the software user documentation.
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Inside the shipping box, the instrument is sealed in a plastic bag to keep the optical components dry. You must allow 24 hours for the instrument to reach room temperature before opening the bag. If the bag is opened before the instrument reaches room temperature, moisture could condense on the optical components and cause permanent damage. |
Your warranty will not cover:
-
Damage due to improper moving techniques.
-
Missing or damaged parts if the shipping boxes are unpacked before our service engineer installs the system.
-
Damage due to removing the sealed plastic bag before the instrument has come to room temperature.
Appendix C: Regulatory compliance
Regulatory compliance
Thermo Fisher Scientific performs complete testing and evaluation of its products to ensure full compliance with applicable domestic and international regulations. When the system is delivered to you, it meets all pertinent standards as described in the next section or sections by product name. This analyzer is sold in multiple configurations.
Regulatory compliance information may be provided for features not included with your device, such as Wi-Fi.
Changes that you make to your system may void compliance with one or more of these requirements. Changes to your system include replacing a part or adding components, options, or peripherals not specifically authorized and qualified by Thermo Fisher Scientific.
To ensure continued compliance with these requirements, replacement parts and additional components, options, and peripherals must be ordered from Thermo Fisher Scientific or one of its authorized representatives.
Cybersecurity
Thermo Fisher Scientific is committed to supporting a secure environment for our customers.
If you think you may have found a possible security vulnerability in one of our products or services, we would like you to identify it, so we can investigate it. To report possible security vulnerabilities please follow the instructions located here: https://corporate.thermofisher.com/us/en/index/about/information-security/Reporting-Security-Issues.html
FCC compliance statement
This device complies with Part 15 of the FCC rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference and (2) This device must accept any interference received, including interference that may cause undesired operation.
Export regulation statement
The technical information contained in this document is subject to the Export Administration Regulations. Export of this technical information to foreign persons or foreign companies, within or outside the United States, may require prior written authorization by the U.S. Department of Commerce, Bureau of Industry and Security. Contact Thermo Fisher Scientific, Inc. prior to any such transfer.
European Union compliance statements
EU authorized representative
Thermo Electron (Karlsruhe) GmbH
Pfannkuchstraße 10-12
76185 Karlsruhe, Germany
EU Declaration of Conformity
The EU Declaration of Conformity for this product is located at: https://www.thermofisher.com/us/en/home/technical-resources/declarations-conformity.html
European WEEE Recycling and RoHS Statements
WEEE Directive 2012/19/EU
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Thermo Fisher Scientific is registered with B2B Compliance (B2Bcompliance.org.uk) in the UK and with the European Recycling Platform (ERP-recycling.org) in all other countries of the European Union and in Norway.
If this product is located in Europe and you want to participate in the Thermo Fisher Scientific Business-to-Business (B2B) Recycling Program, send an email request to weee.recycle@thermofisher.com with the following information:
-
Name of the manufacturer or distributor (where you purchased the product)
-
Number of product pieces
-
Pick-up address and contact person (include contact information)
-
Appropriate pick-up time
-
Declaration of decontamination, stating that all hazardous fluids or material have been removed from the product
IMPORTANT This recycling program is not for biological hazard products or for products that have been medically contaminated. You must treat these types of products as biohazard waste and dispose of them in accordance with your local regulations.
RoHS Directive 2011/65/EU
This product is in conformity with Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the restriction of the use of certain hazardous substances in electrical and electronic equipment as amended by (EU) 2015/863 and (EU) 2017/2102.
People’s Republic of China Compliance Statements
China RoHS
The China RoHS certificate for this product is located at:
Attachment(s):
| File | Last Modified |
|---|---|
| 269-374500A RaptIR X User Manual.pdf | September 08, 2026 |






















