TN 9477 - Obtaining Optimum Results With Quick IR Quality Match
Description:
Quality Match is one of the suite of applications included with OMNIC® Quick IR+. In addition to Quality Match, these include Scan and Plot, Basic FT-IR, System Validation, Peak Measurement and Simple Quant. This note is intended to explain the theory, optimization and applications of the Quality Match program.
Environment:
- FT-IR
- OMNIC® Quick IR+
Attachment(s):
| File | Last Modified |
|---|---|
| TN 9477 - Obtaining Optimum Results With Quick IR Quality Match.pdf | August 04, 2022 |