Latest OMNIC Paradigm User Guide

Manage your data

• Manage Spectral Libraries
• Back up and restore a database
• Delete unwanted measurements with Database Cleanup
• Finding Measurements and Reports
• Import and export data
• View Measurement History
• Revert Measurement
• Duplicate Measurements

Spectroscopy

Time Series analysis

• About Time Series analyses
• Collect time series data
• Import TGA File
• Identify Components in a Time Series Analysis
• Identify unknown material in a Time Series measurement
• Create a Time Series analysis
• Process Time Series Data
• Blank a region of time
• Apply Time Series profiles
• Create a Time Series report
• 3D Analysis
• Manage your Time Series analyses

Microscopy

• View the Sample
• Prepare Measurement Settings
• Capture a Mosaic
• Measure a Background Spectrum
• Analyze Particles
• Analyze Areas, Points, and Lines
• Using the polarizer
• Apply Profiles
• Explore Measurements in Spectra View
• Create and Customize Microscopy Reports

FT-Raman Measurements

• FT-Raman measurements
• Settings for FT-Raman measurements
• Working with the FT-Raman view
• Analyze and process FT-Raman data
• Explore FT-Raman spectra further in the spectra view
• Create FT-Raman Reports

Use Workflows

• About Workflows
• Password Protect a Workflow
• Create a Template Workflow
• Using the Sub Workflow and Embedded Workflow tiles
• Working with Lists in Workflows
• Workflow Tiles Reference

Custom Solutions

• Custom Solutions
• Create or Edit a Package
• Operator Administrator

Protect Your Data

• Data Security and Integrity with OMNIC Paradigm Software
• Enforce a Signature Order
• Secure, Managed Workflows